Template: dpm:SampleThinFilmSampleSubstrateLayer

URI: https://www.dipromag.de/dipromag_onto/0.1/SampleThinFilmSampleSubstrateLayer

Parameters

🛈 The parameters defined by the signature are listed here. Unfortunately parameter names are not informative; fixing it is a planned future feature. An optional parameter will accept the value ottr:none as an argument. A parameter which allows blanks will accept a blank node as argument value.

Index	Name	Type	Optional	Blanks allowed	Default value
1	substrate	ottr:IRI	no	yes	no
2	intended_compound	ottr:IRI	yes	yes	no
3	substrate_dimensions_unit_m	NEList<xsd:float>	no	yes	no
4	oxid_layer_thickness_unit_m	xsd:float	yes	yes	no
5	substrat_layer_thickness_unit_m	xsd:float	yes	yes	no
6	substrate_orientation	NEList<xsd:float>	no	yes	no

Pattern

stOTTR

🛈 stOTTR serialisation of the template without annotation instances.

dpm:SampleThinFilmSampleSubstrateLayer[
    ottr:IRI ?substrate,
    ? ottr:IRI ?intended_compound,
    NEList<xsd:float> ?substrate_dimensions_unit_m,
    ? xsd:float ?oxid_layer_thickness_unit_m,
    ? xsd:float ?substrat_layer_thickness_unit_m,
    NEList<xsd:float> ?substrate_orientation
] :: {
    ottr:Triple(?substrate, dpm:intendedCompound, ?intended_compound),
    ottr:Triple(?substrate, rdf:type, dpm:SampleThinFilmSubstrateLayer),
    o-owl-ax:SubClassOf(dpm:OxidLayerThickness, qudt:Thickness),
    o-owl-ax:SubClassOf(dpm:SampleThinFilmSubstrateLayer, pmd:Sample),
    o-owl-ax:SubClassOf(dpm:SubstratLayerThickness, qudt:Thickness),
    o-rdfs:Label(dpm:OxidLayerThickness, "Oxid Layer Thickness"),
    o-rdfs:Label(dpm:SampleThinFilmSubstrateLayer, "Sample Thin Film Substrate Layer"),
    o-rdfs:Label(dpm:SubstratLayerThickness, "Substrat Layer Thickness"),
    dpm:HasCharacteristicNumerical(?substrate, (pmd:Measurement, qudt:SubstratDimension), ?substrate_dimensions_unit_m, qudt:M),
    dpm:HasCharacteristicNumerical(?substrate, (pmd:Measurement, dpm:OxidLayerThickness), ?oxid_layer_thickness_unit_m, qudt:M),
    dpm:HasCharacteristicNumerical(?substrate, (pmd:Measurement, dpm:SubstratLayerThickness), ?substrat_layer_thickness_unit_m, qudt:M),
    dpm:HasCharacteristicNumerical(?substrate, (pmd:Measurement, dpm:SubstratOrientation), ?substrate_orientation, none)
} .

🛈 The pattern of the template is illustrated by expanding a generated instance. Below the generated instance is shown in different serialisations, and its expansion is presented in different formats.

Generated instance

stOTTR

dpm:SampleThinFilmSampleSubstrateLayer(x:argument1, x:argument2, (_:argument3-1, _:argument3-2), _:argument4, _:argument5, (_:argument6-1, _:argument6-2))

RDF/wOTTR

[ ottr:of      dpm:SampleThinFilmSampleSubstrateLayer ;
  ottr:values  ( x:argument1 x:argument2 ( [] 
                                           [] 
                                         )
                 [] 
                 [] 
                 ( [] 
                   [] 
                 )
               )
] .

Visualisation of expanded RDF graph

🛈 Each resource node is linked to its IRI. Type relationships are not visualised, rather each node contains its type.

Hierarchical horizontal layout (dot)

Hierarchical vertical layout (dot)

Spring model layout (neato)

Spring model layout (fdp)

Radial layout (twopi)

Circular layout (circo)

Expanded RDF graph

x:argument1  rdf:type         dpm:SampleThinFilmSubstrateLayer ;
        pmd:characteristic    [ rdf:type   dpm:OxidLayerThickness , pmd:Measurement ;
                                pmd:unit   qudt:M ;
                                pmd:value  [] 
                              ] ;
        pmd:characteristic    [ rdf:type   qudt:SubstratDimension , pmd:Measurement ;
                                pmd:unit   qudt:M ;
                                pmd:value  ( [] 
                                             [] 
                                           )
                              ] ;
        pmd:characteristic    [ rdf:type   dpm:SubstratLayerThickness , pmd:Measurement ;
                                pmd:unit   qudt:M ;
                                pmd:value  [] 
                              ] ;
        dpm:intendedCompound  x:argument2 .

dpm:SampleThinFilmSubstrateLayer
        rdfs:label       "Sample Thin Film Substrate Layer" ;
        rdfs:subClassOf  pmd:Sample .

dpm:SubstratLayerThickness
        rdfs:label       "Substrat Layer Thickness" ;
        rdfs:subClassOf  qudt:Thickness .

qudt:M  rdfs:subClassOf  qudt:Unit .

dpm:OxidLayerThickness
        rdfs:label       "Oxid Layer Thickness" ;
        rdfs:subClassOf  qudt:Thickness .

Interactive expansion

🛈 Click the list to expand/contract one list element. Click 'expand/contact all' to expand/contract all elements. Note that the interactive expansion is not correct for instances that are marked by list expanders.

dpm:SampleThinFilmSampleSubstrateLayer(x:argument1, x:argument2, (_:argument3-1, _:argument3-2), _:argument4, _:argument5, (_:argument6-1, _:argument6-2))

ottr:Triple(x:argument1, rdf:type, dpm:SampleThinFilmSubstrateLayer)ottr:Triple(x:argument1, dpm:intendedCompound, x:argument2)

o-owl-ax:SubClassOf(dpm:SampleThinFilmSubstrateLayer, pmd:Sample)

ottr:Triple(dpm:SampleThinFilmSubstrateLayer, rdfs:subClassOf, pmd:Sample)

o-owl-ax:SubClassOf(dpm:SubstratLayerThickness, qudt:Thickness)

ottr:Triple(dpm:SubstratLayerThickness, rdfs:subClassOf, qudt:Thickness)

o-owl-ax:SubClassOf(dpm:OxidLayerThickness, qudt:Thickness)

ottr:Triple(dpm:OxidLayerThickness, rdfs:subClassOf, qudt:Thickness)

o-rdfs:Label(dpm:OxidLayerThickness, "Oxid Layer Thickness")

ottr:Triple(dpm:OxidLayerThickness, rdfs:label, "Oxid Layer Thickness")

o-rdfs:Label(dpm:SubstratLayerThickness, "Substrat Layer Thickness")

ottr:Triple(dpm:SubstratLayerThickness, rdfs:label, "Substrat Layer Thickness")

o-rdfs:Label(dpm:SampleThinFilmSubstrateLayer, "Sample Thin Film Substrate Layer")

ottr:Triple(dpm:SampleThinFilmSubstrateLayer, rdfs:label, "Sample Thin Film Substrate Layer")

dpm:HasCharacteristicNumerical(x:argument1, (pmd:Measurement, dpm:SubstratLayerThickness), _:argument5, qudt:M)

ottr:Triple(x:argument1, pmd:characteristic, _:blank1104)

o-owl-ax:SubClassOf(qudt:M, qudt:Unit)

ottr:Triple(qudt:M, rdfs:subClassOf, qudt:Unit)

dpm:ValueObject(_:blank1104, (pmd:Measurement, dpm:SubstratLayerThickness), _:argument5, qudt:M)

ottr:Triple(_:blank1104, pmd:value, _:argument5)ottr:Triple(_:blank1104, pmd:unit, qudt:M)

cross | o-rdf:Type(_:blank1104, ++(pmd:Measurement, dpm:SubstratLayerThickness))

ottr:Triple(_:blank1104, rdf:type, (pmd:Measurement, dpm:SubstratLayerThickness))

dpm:HasCharacteristicNumerical(x:argument1, (pmd:Measurement, qudt:SubstratDimension), (_:argument3-1, _:argument3-2), qudt:M)

ottr:Triple(x:argument1, pmd:characteristic, _:blank1105)

o-owl-ax:SubClassOf(qudt:M, qudt:Unit)

ottr:Triple(qudt:M, rdfs:subClassOf, qudt:Unit)

dpm:ValueObject(_:blank1105, (pmd:Measurement, qudt:SubstratDimension), (_:argument3-1, _:argument3-2), qudt:M)

ottr:Triple(_:blank1105, pmd:value, (_:argument3-1, _:argument3-2))ottr:Triple(_:blank1105, pmd:unit, qudt:M)

cross | o-rdf:Type(_:blank1105, ++(pmd:Measurement, qudt:SubstratDimension))

ottr:Triple(_:blank1105, rdf:type, (pmd:Measurement, qudt:SubstratDimension))

dpm:HasCharacteristicNumerical(x:argument1, (pmd:Measurement, dpm:OxidLayerThickness), _:argument4, qudt:M)

ottr:Triple(x:argument1, pmd:characteristic, _:blank1106)

o-owl-ax:SubClassOf(qudt:M, qudt:Unit)

ottr:Triple(qudt:M, rdfs:subClassOf, qudt:Unit)

dpm:ValueObject(_:blank1106, (pmd:Measurement, dpm:OxidLayerThickness), _:argument4, qudt:M)

ottr:Triple(_:blank1106, pmd:value, _:argument4)ottr:Triple(_:blank1106, pmd:unit, qudt:M)

cross | o-rdf:Type(_:blank1106, ++(pmd:Measurement, dpm:OxidLayerThickness))

ottr:Triple(_:blank1106, rdf:type, (pmd:Measurement, dpm:OxidLayerThickness))

dpm:HasCharacteristicNumerical(x:argument1, (pmd:Measurement, dpm:SubstratOrientation), (_:argument6-1, _:argument6-2), none)

ottr:Triple(x:argument1, pmd:characteristic, _:blank1107)

o-owl-ax:SubClassOf(none, qudt:Unit)

ottr:Triple(none, rdfs:subClassOf, qudt:Unit)

dpm:ValueObject(_:blank1107, (pmd:Measurement, dpm:SubstratOrientation), (_:argument6-1, _:argument6-2), none)

ottr:Triple(_:blank1107, pmd:value, (_:argument6-1, _:argument6-2))ottr:Triple(_:blank1107, pmd:unit, none)

cross | o-rdf:Type(_:blank1107, ++(pmd:Measurement, dpm:SubstratOrientation))

ottr:Triple(_:blank1107, rdf:type, (pmd:Measurement, dpm:SubstratOrientation))

Metrics

🛈 Dependency graph metrics. Depth is the number of steps to a leaf node in the dependency graph. Branching is the number of outgoing edges from a node.

Max. dependency depth: 4
Min. dependency depth: 1
Max. branching: 12
Min. branching: 1

Templates used

Direct dependencies

Number of instances: 12
Templates used: (4 templates)
- ottr:Triple (2)
- o-owl-ax:SubClassOf (3)
- o-rdfs:Label (3)
- dpm:HasCharacteristicNumerical (4)

Complete expansion

Number of instances: 51
Templates used: (7 templates)
- ottr:Triple (28)
- o-owl-ax:SubClassOf (7)
- o-rdf:Type (4)
- o-rdfs:Label (3)
- dpm:HasCharacteristicNumerical (4)
- dpm:SampleThinFilmSampleSubstrateLayer (1)
- dpm:ValueObject (4)

Vocabulary introduced

Direct dependencies

Namespaces introduced: (4)
- rdf: http://www.w3.org/1999/02/22-rdf-syntax-ns#
  - rdf:type
- pmd: https://w3id.org/pmd/co/
  - pmd:Sample
- dpm: https://www.dipromag.de/dipromag_onto/0.1/
- qudt: http://qudt.org/vocab/
  - qudt:M
  - qudt:Thickness

Complete expansion

Namespaces introduced: (5)
- rdf: http://www.w3.org/1999/02/22-rdf-syntax-ns#
  - rdf:type
- pmd: https://w3id.org/pmd/co/
- dpm: https://www.dipromag.de/dipromag_onto/0.1/
- rdfs: http://www.w3.org/2000/01/rdf-schema#
  - rdfs:label
  - rdfs:subClassOf
- qudt: http://qudt.org/vocab/

Serialisations

stOTTR

dpm:SampleThinFilmSampleSubstrateLayer[
    ottr:IRI ?substrate,
    ? ottr:IRI ?intended_compound,
    NEList<xsd:float> ?substrate_dimensions_unit_m,
    ? xsd:float ?oxid_layer_thickness_unit_m,
    ? xsd:float ?substrat_layer_thickness_unit_m,
    NEList<xsd:float> ?substrate_orientation
] :: {
    ottr:Triple(?substrate, dpm:intendedCompound, ?intended_compound),
    ottr:Triple(?substrate, rdf:type, dpm:SampleThinFilmSubstrateLayer),
    o-owl-ax:SubClassOf(dpm:OxidLayerThickness, qudt:Thickness),
    o-owl-ax:SubClassOf(dpm:SampleThinFilmSubstrateLayer, pmd:Sample),
    o-owl-ax:SubClassOf(dpm:SubstratLayerThickness, qudt:Thickness),
    o-rdfs:Label(dpm:OxidLayerThickness, "Oxid Layer Thickness"),
    o-rdfs:Label(dpm:SampleThinFilmSubstrateLayer, "Sample Thin Film Substrate Layer"),
    o-rdfs:Label(dpm:SubstratLayerThickness, "Substrat Layer Thickness"),
    dpm:HasCharacteristicNumerical(?substrate, (pmd:Measurement, qudt:SubstratDimension), ?substrate_dimensions_unit_m, qudt:M),
    dpm:HasCharacteristicNumerical(?substrate, (pmd:Measurement, dpm:OxidLayerThickness), ?oxid_layer_thickness_unit_m, qudt:M),
    dpm:HasCharacteristicNumerical(?substrate, (pmd:Measurement, dpm:SubstratLayerThickness), ?substrat_layer_thickness_unit_m, qudt:M),
    dpm:HasCharacteristicNumerical(?substrate, (pmd:Measurement, dpm:SubstratOrientation), ?substrate_orientation, none)
} .

RDF/wOTTR

dpm:SampleThinFilmSampleSubstrateLayer
        rdf:type         ottr:Template ;
        ottr:parameters  ( [ ottr:name      "substrate" ;
                             ottr:type      ottr:IRI ;
                             ottr:variable  _:b0
                           ]
                           [ ottr:modifier  ottr:optional ;
                             ottr:name      "intended_compound" ;
                             ottr:type      ottr:IRI ;
                             ottr:variable  _:b1
                           ]
                           [ ottr:name      "substrate_dimensions_unit_m" ;
                             ottr:type      ( ottr:NEList xsd:float ) ;
                             ottr:variable  _:b2
                           ]
                           [ ottr:modifier  ottr:optional ;
                             ottr:name      "oxid_layer_thickness_unit_m" ;
                             ottr:type      xsd:float ;
                             ottr:variable  _:b3
                           ]
                           [ ottr:modifier  ottr:optional ;
                             ottr:name      "substrat_layer_thickness_unit_m" ;
                             ottr:type      xsd:float ;
                             ottr:variable  _:b4
                           ]
                           [ ottr:name      "substrate_orientation" ;
                             ottr:type      ( ottr:NEList xsd:float ) ;
                             ottr:variable  _:b5
                           ]
                         ) ;
        ottr:pattern     [ ottr:of      o-rdfs:Label ;
                           ottr:values  ( dpm:OxidLayerThickness "Oxid Layer Thickness" )
                         ] ;
        ottr:pattern     [ ottr:of      o-owl-ax:SubClassOf ;
                           ottr:values  ( dpm:SampleThinFilmSubstrateLayer pmd:Sample )
                         ] ;
        ottr:pattern     [ ottr:of      o-rdfs:Label ;
                           ottr:values  ( dpm:SampleThinFilmSubstrateLayer "Sample Thin Film Substrate Layer" )
                         ] ;
        ottr:pattern     [ ottr:of      o-owl-ax:SubClassOf ;
                           ottr:values  ( dpm:SubstratLayerThickness qudt:Thickness )
                         ] ;
        ottr:pattern     [ ottr:of      ottr:Triple ;
                           ottr:values  ( _:b0
                                          dpm:intendedCompound
                                          _:b1
                                        )
                         ] ;
        ottr:pattern     [ ottr:of      dpm:HasCharacteristicNumerical ;
                           ottr:values  ( _:b0
                                          ( pmd:Measurement dpm:SubstratOrientation )
                                          _:b5
                                          ottr:none
                                        )
                         ] ;
        ottr:pattern     [ ottr:of      dpm:HasCharacteristicNumerical ;
                           ottr:values  ( _:b0
                                          ( pmd:Measurement qudt:SubstratDimension )
                                          _:b2
                                          qudt:M
                                        )
                         ] ;
        ottr:pattern     [ ottr:of      o-owl-ax:SubClassOf ;
                           ottr:values  ( dpm:OxidLayerThickness qudt:Thickness )
                         ] ;
        ottr:pattern     [ ottr:of      o-rdfs:Label ;
                           ottr:values  ( dpm:SubstratLayerThickness "Substrat Layer Thickness" )
                         ] ;
        ottr:pattern     [ ottr:of      ottr:Triple ;
                           ottr:values  ( _:b0
                                          rdf:type dpm:SampleThinFilmSubstrateLayer
                                        )
                         ] ;
        ottr:pattern     [ ottr:of      dpm:HasCharacteristicNumerical ;
                           ottr:values  ( _:b0
                                          ( pmd:Measurement dpm:OxidLayerThickness )
                                          _:b3
                                          qudt:M
                                        )
                         ] ;
        ottr:pattern     [ ottr:of      dpm:HasCharacteristicNumerical ;
                           ottr:values  ( _:b0
                                          ( pmd:Measurement dpm:SubstratLayerThickness )
                                          _:b4
                                          qudt:M
                                        )
                         ] .

Prefixes

🛈 Prefixes are removed from all listings on this page for readability, but are listed here in RDF Turtle format.

@prefix ottr:       <http://ns.ottr.xyz/0.4/>.
@prefix qudt:       <http://qudt.org/vocab/>.
@prefix o-owl-ax:   <http://tpl.ottr.xyz/owl/axiom/0.1/>.
@prefix o-rdfs:     <http://tpl.ottr.xyz/rdfs/0.2/>.
@prefix rdf:        <http://www.w3.org/1999/02/22-rdf-syntax-ns#>.
@prefix xsd:        <http://www.w3.org/2001/XMLSchema#>.
@prefix pmd:        <https://w3id.org/pmd/co/>.
@prefix dpm:        <https://www.dipromag.de/dipromag_onto/0.1/>.

Template: `dpm:SampleThinFilmSampleSubstrateLayer`

Parameters

Pattern

stOTTR

Generated instance

Visualisation of expanded RDF graph

Expanded RDF graph

Interactive expansion

Dependencies

Dependency graph

List of dependencies

Depending templates

Metrics

Templates used

Vocabulary introduced

Serialisations

stOTTR

RDF/wOTTR

Prefixes